Scientific Results
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- Investigation of diffusional intermixing in Si/Co/Ta system by Secondary Neutral
Mass Spectrometry
Vacuum 86 (6) 724-728 (2012) - Depth profile analysis of solar cells by Secondary Neutral Mass Spectrometry
using conducting mesh
Vacuum 86 (6) 721-723 (2012) - Composition depth profile analysis of electrodeposited alloys and metal multilayers: the reverse approach
Journal of Solid-State Electrochemistry15 (11-12) 2523-2544 (2011) - Investigation of grain boundary diffusion in thin films by SNMS technique
Defect and Diffusion Forum 312-315 1208-1215 (2011) - Effect of temperature on the mutual diffusion of Ge/GaAs and GaAs/Ge
Journal of Crystal Growth 318 367-371 (2011) - Nanoscale investigation of shift of individual interfaces in temperature induced processes of Ni-Si system by Secondary Neutral Mass Spectrometry
Applied Physics Letters 97(16) 233103 (2010) - On the composition depth profile of electrodeposited Fe-Co-Ni alloys
Electrochimica Acta 55(16) 4734-4741 (2010) - Investigations of diffusion kinetics in Si/Ta/Cu/W and Si/Co/Ta systems by Secondary Neutral Mass Spectrometry
Vacuum 84(7) 953-957 (2010) - Investigations of failure mechanisms at Ta and TaO diffusion barriers by Secondary Neutral Mass Spectrometry
Vacuum 84(1) 130-133 (2009) - Application of Secondary Neutral Mass Spectrometry in the investigation of doped perovskites
Vacuum 84(1) 144-146 (2009) - Analysis of Co/Cu multilayers by SNMS reverse depth profiling
Vacuum 84(1) 141-143 (2009) - Secondary Neutral Mass Spectrometry - a powerful technique for quantitative elemental and depth profiling analyses of nanostructures
Spectroscopy Europe 21 (4) 13-16 (2009) - Application of surface roughness data for the evaluation of depth profile measurements of nanoscale multilayers
Journal of The Electrochemical Society 156 (7) D253-D260 (2009) - Spontaneous near-substrate composition modulation in electrodeposited Fe-Co-Ni alloys
Electrochemistry Communications 11 1289-1291 (2009) - Depth profile analysis of electrodeposited nanoscale multilayers by SNMS
Vacuum 82 270-273 (2008) - Investigation of Sb diffusion in amorphous silicon
Vacuum 82 257-260 (2008) - Electrodeposition of Ni-Co-Cu/Cu multilayers: 2.Calculation of element distribution and experimental depth profile analysis
Electrochimica Acta 53 837-845 (2007)