Magyar
| APHA-code | P21945 |
| Authors | Simon A., Sulyok A., Novák M., Juhász G., Lohner T., Fried M., Barna A., Huszánk R., Menyhárd M. |
| Title | Investigation of an ion-milled Si/Cr multilayer using micro-RBS, ellipsometry and AES depth profiling techniques. |
| Megjelenés helye | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 267 (2009) 2212 |
| Impact factor | 1.156 |
| Megnézem | DOI Hivatkozások (2) |
